Socket connection test modules and methods of using the same

ABSTRACT

Test modules, systems, and methods employing capacitors for the testing of the solder joint connections between a printed circuit board (PCB) and a socket of a device are presented in embodiments of the current invention. A test module having capacitors in parallel, and in particular embedded capacitors, can be used to test tied traces and their solder joint connections by measuring the total capacitance of the capacitors. Embodiments of the current invention present no-power tests that can be used with a variety of testing platforms and test fixtures, such as in-circuit testing (ICT) and manufacturing defect analysis (MDA.) Additionally, the test module can be used with a variety of sockets, such as a ball grid array, a pinned grid array, and a land grid array.

BACKGROUND OF THE INVENTION

1. Field of the Invention

Embodiments of the present invention relate to the field of testingelectrical connections and traces of an electronic device and a printedcircuit board. More particularly, embodiments of the present inventionrelate to the use and integration of parallel capacitors with externalor embedded capacitors in a test module to test the connections betweena printed circuit board, or a motherboard, and a device socket.

2. Discussion of Related Art

It is valuable to be able to test the electrical connections between thesockets of electronic devices and a printed circuit board (PCB) ormotherboard, as well as the integrity of the traces within the testingequipment, socket, and PCB. The inspection of the socket connections toa PCB is valuable because open solder joints, broken pins, springs, orother poor connections on any of the signal connections may result inthe processor malfunctioning, or failing to boot altogether. Openings onthe power and ground connections may cause the processor to malfunctionunder a heavy load, cause hot spots due to excessive current in theconnected power and ground pins, or cause reliability issues over timeat the customer end.

The type of socket used varies based on how a device is designed toconnect to a socket and a PCB. In the past, devices were typicallyconnected to a socket and a PCB by through pins. Therefore, pinned gridarray sockets having pins were used. Devices have evolved from throughboard pins to the surface mounting of a device to a socket and PCB. Adevice that is designed to be surface mounted has pads, or flatconductive discs, on its packaging. For a ball grid array (BGA) devicethere will be solder bumps on the pads for connection with a BGA socket.The solder bumps typically fit into grips on a BGA socket for connectionto a PCB. A land grid array (LGA) device only has pads. The pads of anLGA require a socket containing springs or some other type of conductivetrace to connect the device to the PCB. Human visual inspection of thesolder joints within a BGA socket or the conductive traces within a LGAsocket is not possible. Therefore, test modules that connect to thesocket to test its connection to a PCB have been developed.

Testing the connections between a socket and a PCB can be performed in anumber of ways. The testing methods can be divided into two groups. Onegroup is the “power-up” tests that require powering up the board anddevice. The other group is the “no-power” tests that do not requirepowering up the board and devices. In a “no-power” test only theequipment that is used for transmitting or receiving an electricalsignal has power. The “no-power” tests are preferred because they do notrequire turning on the individual devices on a PCB or extensiveknowledge about the devices in order to determine that the correctdevice has been properly connected, oriented, and soldered. “No-power”tests also offer the advantages of testing connections during assemblyand of compatibility with both in-circuit testers (ICT) andManufacturing Defect Analyzer (MDA) testers. Compatibility with MDAtesters is valuable because they are widely used by Far East boardmanufacturing.

One prevalent “no-power” test is the Agilent™ TestJet™ technique. Thistechnique takes advantage of the lead frame present in most socketconnectors. The lead frame is a metal framework that includes thedevices input, output, and power traces and their extensions up to thepoint where an IC or a socket connector is attached. As used in thisdescription, the term trace refers to the conductive element (like awire or pin) within a component such as a PCB or a socket. The size andshape of the lead frame is fairly consistent between devices andvendors. The TestJet™ technique for testing socket connections uses atest module adapted to the particular type of socket to be tested (forexample, if a pin grid array socket is being tested the test module willhave pins) and an external sensing plate that is suspended above thesocket, and separated from the lead frame. The lead frame and theexternal plate form a small capacitance that can be measured by the ICTor MDA testers via the application of an AC source. Because each socketconnection between a socket and a PCB consists of a part of the leadframe, each connection can be detected as a separate capacitance valuefor testing purposes.

When a socket connection is not properly connected to the PCB there willbe an additional capacitor in series with the TestJet™ capacitor. Thisadditional capacitance exists because there is a tiny air gap within thesocket connection trace. The series combination of the TestJet™capacitor and this additional pin capacitor is smaller than eithercapacitor. Therefore, the TestJet™ technique measures the capacitance ateach socket connection, and identifies each socket connection that has acapacitance smaller than the expected capacitance for that socketconnection. By this technique, poor connections and traces within thePCB and socket can be detected. But, the TestJet™ technique haslimitations in its ability to detect traces (or pins) within the PCBthat are tied, such as the commonly tied power or ground traces. This isbecause the TestJet™ tests in serial mode, testing one trace at onesocket connection at a time. If the trace being tested is a tied tracethat is broken or has an open solder joint, the test signal will stillgo through, and the expected capacitance will be read for the tied tracebeing tested, even if only one of the tied traces is intact and has agood solder joint. The TestJet™ can thus fail to detect broken traces oropen solder joints on tied traces. The TestJet™ also has difficultlydetecting weak signals due to shorter signal propagation paths incurrent generations of sockets.

Another testing device that could be used to detect the integrity ofelectrical connections and traces is the FET TCT (Field EffectTransistor Through Connector Testing) (Published patent application US2003/0057981 Al, Assigned to Intel Corporation). The FET TCT is a“power-up” test because it requires the board under test (BUT) to beproperly powered-up prior to testing. The FET TCT consists of an arrayof FET pairs on a test module. One FET in such a pair connects a singlesignal trace to a single power trace and the other FET connects thesignal trace to a single ground trace. Multiple FET pairs are used toconnect all signal traces to independent power and ground traces. Thegates of the high side FETS are connected to a common control tracewithin the test module and the gates of the low side FETS are connectedto a second control trace within the test module. When the controlsignal for the high side FET is driven high by the tester, a continuitypath should exist through the power trace, the high side FET, and backthrough the signal trace. If all traces were soldered properly, adigital high state should be measured on the signal traces when the highside FET's are active. When the control signal for the low side FET isdriven high by the tester, a continuity path should exist through thesignal trace, the low side FET, and back through the ground trace. Ifall traces were soldered properly, a digital low state would be measuredon the signal trace, or the power/ground trace used by that FET pair.

Although the FET TCT can detect the solder connections and traces oftied signal and ground traces, it requires an attachment to everysignal, ground, and power trace. Because of this requirement, the FETTCT must have a large footprint that can cause fixture design issues anddifficulty of use. As the number of traces increases and devices arefurther scaled down, the FET TCT will become even larger and moredifficult to use. Additionally, the FET TCT is a power-up test that isonly compatible with an in-circuit tester and not an MDA tester typethat is widely used by Far East board manufacturing. The FET TCT is alsonot easily compatible with a land grid array (LGA) CPU because an LGA istypically quite fragile and a bulky FET TCT test module could causesignificant harm.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is an illustration of a cross-sectional view of a test systemincluding a test module having embedded capacitors in parallel.

FIG. 2 is an illustration of cross-sectional view of a test systemincluding a test module having capacitors in parallel and havingextended traces.

FIG. 3 is an illustration of a cross-sectional view of a test systemincluding a test module having capacitors in parallel and a pair ofswitching devices, in this case FET's.

DETAILED DESCRIPTION OF THE PRESENT INVENTION

Embodiments of the present invention provide methods and devicesemploying capacitors for testing the integrity of the electricalconnections between a printed circuit board (PCB) and a socket of adevice as well as the traces within the PCB and socket. In the followingdescription, numerous specific details are set forth. One of ordinaryskill in the art, however, will appreciate that these specific detailsare not necessary to practice embodiments of the invention. Whilecertain exemplary embodiments of the invention are described and shownin the accompanying drawings, it is to be understood that suchembodiments are merely illustrative and not restrictive of the currentinvention, and this invention is not restricted to the specificconstructions and arrangements shown and described because modificationsmay occur to those ordinarily skilled in the art.

Described herein are embodiments of test modules, systems, and methodsemploying capacitors for the testing of the connections between aprinted circuit board (PCB) and a socket of a device as well as theintegrity of electrical traces. As used in this description, the termtrace refers to the conductive element (like a wire or pin) within acomponent such as a PCB or a socket. The connections between a PCB and asocket can be solder joints, pins, or some other conductive elementwithin a socket. A test module having capacitors, and in particularembedded capacitors, can be used to test the connections between asocket and the tied and untied traces of a PCB.

The integrity of an untied trace within a PCB can be tested by measuringthe capacitance of a capacitor in series with an untied trace, and theintegrity of tied traces can be tested by measuring the totalcapacitance of capacitors in parallel with one another and coupled tothe tied traces. Embodiments of the current invention present no-powertests that can be used with a variety of testing platforms and testfixtures, such as in-circuit testing (ICT) and manufacturing defectanalysis (MDA). Additionally, the test module can be designed for usewith a variety of sockets, such as a ball grid array, a pin grid array,and a land grid array.

FIG. 1 illustrates a cross section of an embodiment of a test system 100that includes a test module 101, a BGA socket 102, a motherboard 103,and a test fixture 104. The test module 101 has several traces, 120-129,that connect to test module connection points 130-139 and to theembedded capacitors 111-117. Embedded capacitors are capacitors that areembedded into a substrate. The substrate can be any type of insulatormaterial, but in particular any type of fiber glass material such as FR4(fire redundant), FR5, and Getek. These are all fiberglass material withdifferent compositions. The size of the embedded capacitors is dependenton the PCB or motherboard manufacturer design. In an alternateembodiment, the embedded capacitors 111-117 can be SMT (Surface MountTechnology) capacitors mounted externally on the substrate surface ofthe test module 101. The SMT capacitors can be sizes such as 0603farads, 0402 farads, and 0201 farads. For example, 0402 means 40 milslength×20 mils width. Because the embedded capacitors or the SMTcapacitors can have very small dimensions, the footprint of the testmodule 101 can also be very small and adapted to test a variety ofsockets.

The BGA socket 102 has traces 140-149 to which the test moduleconnection points 130-139 are connected. The test module 101 can beadapted to test a broad range of sockets. FIG. 1 illustrates a ball gridarray socket 102 for a CPU. Other types of sockets such as a pin gridarray and a land grid array could also be tested. The flexibility of thedesign of the test module 101 is valuable because it can be designed totest a variety of different sockets. One alternate socket is the landgrid array (LGA) socket, which can be tested by an embodiment of a testmodule of the present invention without the use of an adapter to makethe socket compatible with most test modules. Avoiding the use of anadapter is valuable because LGA sockets are typically fragile and have alarge number of connection points (such as springs or a conductivecomposite). Additionally, a test module 101 employing embeddedcapacitors or SMT capacitors can have a small footprint, therebyreducing the weight exerted on the socket by the module. The sockettested can be for different types of devices such as a centralprocessing unit (CPU), an accelerated graphics port (AGP), a peripheralcomponent interconnect (PCI), a dual in-line memory module (DIMM), adynamic random access memory (DRAM), and a communication and networkriser (CNR).

The motherboard 103 has traces 160-169 that are connected to the traces140-149 of the BGA socket 102 by solder joints 150-159. The motherboard103 also contains power plane 170 that ties the power traces 162, 163,and 164 to the trace 171, and the ground plane 172 that ties the groundtraces 166, 167, and 168 to the trace 173. The motherboard 103 canalternately be any type of PCB, or “card.” The traces 160, 161, 171, and173 of the motherboard 103 are connected to the test fixture 104 throughtest points 180-185 and through test probes 190-195. If a socket usingthrough pins is employed, such as a pin grid array, then the testpointswould instead be connector leads. The test fixture 104 is used to sendtest signals through the tester probes and into the motherboard 103,socket 102, and test module 101. The test fixture is also used toreceive and measure the test signals after they have gone through thetest system.

In an embodiment of the present invention, the solder joints 150-159 andthe electrical traces throughout the circuits formed by the test system100 are tested by the method of sending a test signal from the testfixture 104 into a circuit including at least one capacitor that isformed by the test system 100. To test untied traces, a circuit isformed within the test system 100 that includes an untied trace and acapacitor in series with the untied pin. For example, in an embodimentof the current invention, the untied traces within the motherboard 160and 161 are tested by sending an input signal from the test fixture 104through the tester probe 191 through the circuit formed by test point181, motherboard trace 161, solder joint 151, socket trace 141, testmodule connection point 131, test module trace 121, embedded capacitor111, test module trace 120, test module connection point 130, sockettrace 140, solder joint 150, motherboard trace 160, test point 180, andtester probe 190. The input signal is typically around 1 kHz and can beanalog (A/C) or digital. In either case, the motherboard does not needto be powered up. The capacitance of the capacitor 111 is received andmeasured by the test fixture 104. Depending on the board design, thecapacitance can be anywhere from the femtofarad range up to themicrofarad range. If the measured capacitance is less than expected itwill signal an open on one of the solder joints 150 or 151, a brokentrace, or a poor connection somewhere along the trace formed by thecircuit between the tester probes 190 and 191. Please note that theinput signal could also have been sent through the circuit from thetester probe 190.

The method of testing tied traces is similar except that multiple tracesin parallel and multiple capacitors in parallel are present in thecircuit formed in the test system 100, and a total capacitance ismeasured by the test fixture 104. In an embodiment of the presentinvention, the tied power traces 162, 163, and 164 within themotherboard 103 are tested by sending an input test signal from the testfixture 104 into a circuit formed in the test system 100 by the testerprobe 193, the testpoint 183, the signal trace 165 that runs through themotherboard 103, the solderjoint 155, the socket trace 145, the testmodule connection point 135, the test module trace 125, the embeddedcapacitors in parallel 112, 113, and 114, the test module traces inparallel 122, 123, and 124, the test module connection points 132, 133,and 134, the socket traces 142, 143, and 144, the solder joints 152,153, and 154, the tied motherboard traces in parallel 162, 163, and 164,the power plane 170, the trace 171, the test point 182, and the testerprobe 192. The total capacitance is then received and measured by thetest fixture 104. By measuring the total capacitance of the parallelcapacitors 112, 113, and 114, the integrity of the individual powertraces in the tied trace arrangement can be determined. If the totalcapacitance value is less than expected it will signal that there is anopen solder joint, a broken trace, or a poor connection somewhere alongthe trace formed by the circuit between the tester probes. Also, thetotal capacitance measured for tied power traces can be split into asmaller group to provide better test result and better diagnosticcapabilities. For example, if there are 20 power traces tied together,instead of measuring the total capacitance of 20 parallel capacitors,the test fixture can split them into two tests of 10 parallel capacitorseach. Testing smaller groups of tied pins will make it easier todetermine which trace has an open or a defect.

The tied ground traces 115, 116, and 117 can be tested in the same wayas the tied power traces. An input test signal is sent from the testfixture 104 into a circuit formed by test probe 194, testpoint 184,signal trace 169 that runs through the motherboard 103, the solder joint159, the socket trace 149, the test module connection point 139, thetrace within the test module 129, the embedded capacitors in parallel115, 116, and 117, the test module traces in parallel 126, 127, and 128,the test module connection points 136, 137, and 138, the socket traces146, 147, and 148, the solder joints 156, 157, and 158, the motherboardtraces 166, 167, and 168, the ground plane 172, the trace 173, thetestpoint 184, and the tester probe 194. By testing the totalcapacitance of the capacitors in parallel in this circuit, the integrityof the tied traces and their solder joints can be determined. The totalcapacitance measured for tied ground pins can be split into a smallergroup to provide better result and better diagnostic capability.

In an alternate embodiment of the present invention, embedded capacitorsin parallel are used in combination with an improved TestJet™ type testmodule. This test module uses embedded capacitors in parallel to testtied traces, such as tied signal traces, power traces, and groundtraces, and can elongate the traces to form an enlarged signal surfaceto improve the detection of signal traces. This embodiment isillustrated in FIG. 2. The socket 250 in this embodiment is for a pingrid array and thus the traces will be pins in the test system. In thisembodiment, a testing system 200 includes an external capacitor plate210, such as an Agilent TestJet™ sensor plate, that is suspended aboveand separated from the test module 220. The test module 220 includesembedded parallel capacitors 230 that are coupled to tied power pins 231or tied ground pins 235 of the device socket 250, and enlarged signalsurfaces (longer traces) 240 that are coupled to untied signal pins 245of the device socket 250.

In a preferred embodiment, the test module 220 will have extended traceson the signal pins 245 to form enlarged signal surfaces 240. The use ofextended traces will amplify the capacitance value with the externalcapacitor plate 210 according to the equation C=eA/d×8.85×10⁻¹² Farad,where the length of the traces is “d”. The extended traces will thusgreatly improve the detection of weak signals, and are of particular usewith device sockets having short traces, such as a land grid arraysocket. The extended traces have a length dependent on the threevariables in the above equation. Those variables being the area of thecapacitor (A) and (d) the distance in between the sensor plate and thesignal surface. Additionally, the length of the traces is dependent onthe type of socket and board used. In most circumstances, the traces ofthe enlarged signal surfaces will have lengths of between 10 mm and 100mm. Extended traces are valuable in testing boards and devices havingshort traces, and can be used in combination with already existingTestJet™ equipment and methodology. Additionally, it is a no-power test,which means that it can be used with both ICT and MDA testers.

The test module 220 is cradled in a connector 250 that can be a socketfor a CPU, an AGP, a PCI, a CNR, a DIMM, or similar devices requiringsockets. The connector 250 is coupled to the printed circuit board (PCB)260, or alternately a motherboard, by the through pins 245, 231, and235. Alternately, if the socket is a ball grid array, the connector 250can be coupled to the PCB 260 by solder joints. Test probes 280 arecoupled to the board 260 by connector leads 270, or alternately,testpoints if the connector 250 has a ball grid array socket. The testprobes 280 are coupled to the test fixture 290, which can be an ICT oran MDA.

The integrity of the tied pins such as tied power pins 231, and the tiedground pins 235, is measured using the embedded capacitors in parallelas described in the above embodiment. The integrity of the untied signalpins 245 is determined by measuring the capacitance created by theexternal capacitor plate 210, which can be a TestJet™ sensor plate, andthe enlarged signal surfaces 240. The capacitance created will indicatewhether the signal pins 245 are broken, have open solder joints (ifthrough pins are not used), or have poor connections. If a pin is brokenor there is an open solder joint, an additional capacitance will becreated by the tiny air gap. The series combination of the capacitorcreated by the external capacitor plate 210 and the enlarged signalsurfaces 240 and the additional capacitor created by an open or breakageof a pin is smaller than either capacitor. An open solder joint orbroken pin will also be indicated if no capacitance, a negativecapacitance, or a low capacitance is measured by the test fixture 290. Anegative or low capacitance as the test result would mean that the ACsignal is not being properly propagated to the external capacitor plate210. Therefore, each signal pin that has no capacitance, or acapacitance value smaller than expected for that pin, can be identifiedas having a problem.

In another embodiment of the present invention, a test module combinesparallel embedded capacitors with a field effect transistor throughconnector tester (FET TCT). The embedded capacitors are to test theconnections of tied pins (power, ground, and signal) or untied power andground pins. The FET TCT is to test the connections of untied signalpins. The footprint of a FET TCT test module is reduced by usingparallel embedded capacitors to test the tied pins of a device socket.This combination of a FET TCT and parallel embedded capacitors also doesnot require that the board be powered up and a simple analog or digitaltest methodology can be used, making the test module compatible with agreater range of testers. The board does not need to be powered upbecause the power and ground pins, that would require power on the boardwith a FET TCT, are tested using the embedded capacitor methodology thatdoes not require powering up the board. Also, the signal pins can betested by the FET TCT testing methodology without powering up the board.The FET TCT test methodology can be a no-power test for signal pins andstill detect manufacturing defaults such as open, missing, and poorsolder joints.

This embodiment is illustrated in FIG. 3. In this embodiment a ball gridarray (BGA) socket is used. The test module 300 includes two sets ofembedded capacitors in parallel, 305 and 306. The test module alsoincludes a FET TCT that includes at least one FET pair 315 comprising afirst FET 316 and a second FET 317. Although FET's are used in apreferred embodiment, any switching device can be employed. The firstFET 316 is connected to a first control trace 318 by its gate electrode,and the second FET 317 is connected to a second control trace 319 by itsgate electrode. The test module 300 is coupled to the traces of a devicesocket 320, such as a CPU socket, through the test module connectionpoints 380. In this embodiment of the invention, the first FET 316 iscoupled by a source or a drain region to the first signal trace 345 thatruns through the PCB 340 and the socket 320, and by a source/drainjunction to the second signal trace 346 that runs through the PCB 340and the socket 320. The second FET 317 is similarly coupled to thesecond signal trace 346 and the third signal trace 347. The embeddedcapacitors in parallel 305 in the test module 300 are coupled to thetied power traces 341 and the embedded capacitors in parallel 306 arecoupled to the tied ground traces 342. The device socket 320 has a ballgrid array, although it could also be a land grid array or a pinned gridarray. The device socket 320 is coupled by solder joints 330 to aprinted circuit board (PCB) 340. The PCB 340 can also be a motherboard.In the PCB 340, the tied power traces 341 are tied by the power plane343 and are in series with the connector lead 351. The tied groundtraces 342 are tied by the ground plane 344 and are in series with theconnector lead 352. Connector leads 350 protrude from the board 340 andcan be coupled to tester probes 360. The tester probes 360 are coupledto a fixture 370, which can be an in-circuit tester (ICT) or amanufacturing defect analyzer (MDA).

Tied traces such as tied power traces 341 and tied ground traces 342 canbe tested by the embedded capacitors in parallel 305, and 306, asdescribed above. Untied signal traces such as the untied signal traces345, 346, and 347 are tested by the FET TCT pair 315. Multiple FET pairscan be in an array to connect to all of the signal traces that need tobe tested. FIG. 3, for the sake of simplicity, illustrates only threesignal traces (345, 346, and 347), but it is to be understood that therecan be many more. To test the untied signal traces 345, 346, and 347,the two FET's in the FET TCT pair are activated separately. The firstFET 315 is a high side FET connected to first signal trace 345 by asource region, and to second signal trace 346 at a source/drainjunction, and to the control trace 318 by its gate electrode. If thereis an array of FET TCT's to test other signal traces, the high sideFET's in each of those pairs will also be connected to the control trace318, so that many signal traces can be tested at once. The tester willsend a control signal through test probe 364 to the control trace 318 tothe FET 315 and to any other FET's connected to the control trace in thearray. This will create a continuity path through the first signal trace345, the FET 315, and the second signal trace 346. Once a control signalis sent from control trace 365 to the gate electrode of FET 315 acontinuity path is created between the test fixture 370, test probe 361,PCB trace 345, through the drain/source region of the FET 315, and thenback through the source/drain region of FET 315 to PCB trace 346, testprobe 362, and the test fixture 370. A test signal from the test fixture370 can be sent through this path to be received and measured by thetest fixture 370. Other FET's attached to control trace 315 in the arraywill experience a similar continuity path. If all of the signal tracesare soldered properly, an electronic high state (either digital oranalog) will be measured on the signal traces 345 and 346 by the testprobes 361 and 362 when the FET is active.

Similarly, the low side FET 316 in the FET TCT pair 310 will test thesignal traces 345 and 346. A control signal is sent by the test fixture370 through the test probe 365 to the control trace 318. The controltrace 318 would be coupled to all other low side FET's on their gateelectrodes in a FET TCT array. When the control signal for the low sideFET 316 is driven high by the tester, a continuity path should existthrough signal trace 346 attached to the source/drain junction, the gateelectrode of the FET 316, and the signal trace 347 attached to the drainof FET 316. If the signal traces 346 and 347 are soldered properly, anelectronic low state (analog or digital) will be measured by the testprobes 362 and 363 on the signal traces 346 and 347, respectively.

Thus, what have been described are embodiments of a test system, a testmodule, and methods of using the same to test the solder joints betweena device socket and a printed circuit board. In the foregoing detaileddescription, the embodiments of the present invention are exemplary andit will be evident that various modifications and changes may be madethereto without departing from the broader spirit and scope of thepresent invention. The present specification and figures are accordinglyto be regarded as illustrative rather than restrictive.

1. A method comprising: coupling a plurality of capacitors in parallelwith one another to a plurality of tied traces of a socket; coupling theplurality of capacitors to a test fixture at a first electricalconnection; coupling the plurality of tied traces to the test fixture ata second electrical connection; and sending a test signal from the testfixture through the first electrical connection to the second electricalconnection to measure a total capacitance of the plurality of capacitorsin parallel with one another.
 2. The method of claim 1 wherein each ofthe tied traces in the plurality of tied traces contains a solder jointbetween the socket and a printed circuit board.
 3. The method of claim 1wherein coupling the plurality of capacitors to a test fixture at afirst electrical connection comprises connecting the plurality ofcapacitors to a signal trace and connecting the signal trace to thefirst electrical connection.
 4. The method of claim 1 furthercomprising: positioning an external capacitor plate above an at leastone untied trace of the socket to form a capacitor with the at least oneuntied trace; coupling the at least one untied trace to the test fixtureat a third electrical connection; coupling the external capacitor plateto the test fixture at a fourth electrical connection; and sending atest signal from the test fixture through the third electricalconnection to the fourth electrical connection to measure a capacitanceof the capacitor formed by the external capacitor plate and the untiedtrace.
 5. The method of claim 1 further comprising: coupling a firstswitching device to a first untied trace of the socket and to a seconduntied trace of the socket; coupling a second switching device to thesecond untied trace and to a third untied trace of the socket; couplingthe first switching device to the test fixture through a first controltrace at a third electrical connection; coupling the second switchingdevice to the test fixture through a second control pin at a fourthelectrical connection; coupling the first untied trace and the seconduntied trace to the test fixture at a fifth electrical connection;coupling the second untied trace and the third untied trace to the testfixture at a sixth electrical connection; sending a first control signalfrom the third electrical connection of the test fixture to the fifthelectrical connection to measure a first electronic state of a firstcontinuity path formed by the first control signal; and sending a secondcontrol signal from the fourth electrical connection of the test fixtureto the sixth electrical connection to measure a second electronic stateof a second continuity path formed by the second control signal.
 6. Amethod for testing traces comprising: coupling an embedded capacitorwithin a test module to a trace of a socket; coupling a first electricalconnection to the embedded capacitor; coupling a second electricalconnection to the trace; and sending a test signal from the test fixturethrough the first electrical connection to the second electricalconnection to measure a capacitance of the embedded capacitor.
 7. Themethod of claim 6 wherein the socket is a ball grid array.
 8. The methodof claim 6 wherein the socket is a land grid array.
 9. A methodcomprising: coupling a plurality of capacitors in parallel with oneanother to a plurality of tied traces of a socket, wherein the tiedtraces are selected from the group comprising ground traces and powertraces; coupling a test fixture at a first electrical connection to theplurality of capacitors; coupling a test fixture at a second electricalconnection to the plurality of tied traces; sending a test signal fromthe test fixture through the first electrical connection to the secondelectrical connection to measure a total capacitance of the plurality ofcapacitors in parallel with one another; positioning an externalcapacitor plate above an at least one untied signal trace of the socketto form a capacitor with the at least one untied signal trace; couplingthe at least one untied trace to the test fixture at a third electricalconnection; coupling the external capacitor plate to the test fixture ata fourth electrical connection; and sending a test signal from the testfixture through the third electrical connection to the fourth electricalconnection to measure a capacitance of the capacitor formed by theexternal capacitor plate and the untied trace.
 10. The method of claim 9wherein the at least one signal trace has an extended signal surface.11. The method of claim 9 wherein the plurality of capacitors inparallel are embedded in a test module.
 12. A test module comprising: afirst plurality of socket connectors; and a plurality of capacitors inparallel with one another coupled to the first plurality of socketconnectors.
 13. The module of claim 12 further comprising extendedtraces connected to a second plurality of socket connectors.
 14. Thetest module of claim 12 further comprising: a first switching devicecoupled to a first individual socket connector and coupled to a secondindividual socket connector; a second switching device coupled to thesecond individual socket connector and to a third individual of socketconnector; a first control trace coupled to the first switching device;and a second control trace coupled to the second switching device. 15.The module of claim 12 wherein the capacitors in parallel are embeddedin the module.
 16. The module of claim 12 wherein the capacitors inparallel are mounted on the surface of the module.
 17. A test modulecomprising: an at least one embedded capacitor within a substrate; andan at least one socket connector coupled to the at least one embeddedcapacitor.
 18. The test module of claim 17 wherein the at least oneembedded capacitor is in parallel with at least one other capacitor. 19.The test module of claim 17 wherein the test module is designed to becompatible with a ball grid array socket.
 20. A system for sockettesting comprising: a socket having traces, including tied traces; amodule comprising capacitors in parallel with one another to test thetied traces of the socket, the module electrically attachable to thesocket; a printed circuit board containing a footprint for connection tothe traces of the socket; and a test fixture electrically connected tothe traces of the socket through the printed circuit board and capableof supplying test signals to detect open connections on the traces ofthe socket.
 21. The system of claim 20 wherein the socket is designed tobe compatible with a ball grid array device.
 22. The system of claim 20wherein the tied traces are selected from the group consisting of powertraces and ground traces.
 23. A system for socket testing comprising: asocket having untied signal traces, tied ground traces, and tied powertraces; an external capacitor plate; a test module comprising extendedtraces that are connectable to the untied signal traces of the socketand embedded capacitors in parallel that are connectable to the tiedground traces and the tied power traces of the socket; a printed circuitboard containing a footprint for connection to the traces of the socket;and a test fixture electrically connected to traces of the socketthrough the printed circuit board and capable of supplying test signalsto detect open connections on the traces of the socket.
 24. The systemof claim 23 wherein the socket has a land grid array.
 25. The system ofclaim 23 wherein the test fixture is a Manufacturing Defect Analyzer.